A CZT (Cadmium Zinc Telluride) strip detector is a type of radiation sensor that uses a CZT crystal segmented into narrow strips to detect X-rays or gamma rays with high spatial and energy resolution. The strip configuration allows for precise position-sensitive measurements, enabling imaging and spectroscopy applications in fields such as medical diagnostics, industrial inspection, and security screening, while operating efficiently at room temperature.
CZT Strip Detector
Critical for military, aerospace, meteorology, astronomical observation, railway safety, and search & rescue operations
Application Fields
Performance Specifications for Nuclear Radiation Detection Wafers
Technical Parameters
| No | Product Specifications | Technical Specifications | |
| 1 | Material | Cd0.90Zn0.10Te | |
| 2 | Conduction Type | P-Type | |
| 3 | Wafer Diameter (±0.1mm) | Customizable Dimensions | |
| 4 | Wafer Thickness (±0.05mm) | 1/2/5/Custom-made | |
| 5 | Crystal Orientation | [111] or other crystal orientations | |
| 6 | X-ray Rocking Curve (FWHM) | ≤30rad·s | |
| 7 | Zn Composition (x in Cd₁₋ₓZnₓTe) | 0.10±0.04 | |
| 8 | Precipitate Density (Particle Size Distribution) | 5~10㎛ | ≤1.0×103/㎠ |
| 1~5㎛ | ≤5×103/㎠ | ||
| 9 | Etch Pit Density (EPD) | ≤5×104/cm2 | |
| 10 | Resistivity (ρ) | ≥6×1010Ω·cm | |
| 11 | IR Transmittance | ≥60% (wavelength range: 1.5 μm to 25 μm) | |
| 12 | Surface Roughness (Ra) | Double-side polishing,Ra≤5nm | |
| 13 | Total Thickness Variation (TTV) | ≤15um | |
| 14 | Leakage Current (ΙLEAK) | ≤1nA/mm2(@-600VBias voltage, room temperature) | |
| 15 | Electron Mobility-Lifetime Product (μτₑ) | ≥10-3cm2/V | |
| 16 | Hole Mobility-Lifetime Product (μτₕ) | ≥10-5cm2/V | |
| 17 | Maximum Photocurrent (Unpolarized) | 1000nA(60-second X-ray exposure,120KV) | |
| 18 | X-ray Response Linearity | ≥99% | |
| 19 | X-ray Response Uniformity | ≤10% | |
| 20 | Energy Resolution | ≤6%(Am241@59.5KeV) | |
| 21 | Dimensions | Custom-made | |
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CZT Detectors
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Equipments
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