CZT Pixelated Detector | Prosun Semiconductor

A CZT (Cadmium Zinc Telluride) pixelated detector is a high-resolution radiation sensor that divides a CZT crystal into an array of small, discrete pixels. Each pixel acts as an individual detection element, enabling precise spatial and energy measurements of X-rays or gamma rays. This configuration provides excellent imaging capabilities, high energy resolution, and room-temperature operation, making CZT pixelated detectors ideal for applications in medical imaging, nuclear spectroscopy, security screening, and industrial inspection where detailed radiation mapping is required.

CZT Pixelated Detector

Critical for military, aerospace, meteorology, astronomical observation, railway safety, and search & rescue operations

Application Fields

Performance Specifications for Nuclear Radiation Detection Wafers

Technical Parameters

No	Product Specifications	Technical Specifications
1	Material	Cd0.90Zn0.10Te
2	Conduction Type	P-Type
3	Wafer Diameter (±0.1mm)	Customizable Dimensions
4	Wafer Thickness (±0.05mm)	1/2/5/Custom-made
5	Crystal Orientation	[111] or other crystal orientations
6	X-ray Rocking Curve （FWHM）	≤30rad·s
7	Zn Composition (x in Cd₁₋ₓZnₓTe)	0.10±0.04
8	Precipitate Density (Particle Size Distribution)	5~10㎛	≤1.0×103/㎠
		1~5㎛	≤5×103/㎠
9	Etch Pit Density (EPD)	≤5×104/cm2
10	Resistivity (ρ)	≥6×1010Ω·cm
11	IR Transmittance	≥60% (wavelength range: 1.5 μm to 25 μm)
12	Surface Roughness (Ra)	Double-side polishing，Ra≤5nm
13	Total Thickness Variation (TTV)	≤15um
14	Leakage Current (ΙLEAK)	≤1nA/mm2（@-600VBias voltage, room temperature）
15	Electron Mobility-Lifetime Product (μτₑ)	≥10-3cm2/V
16	Hole Mobility-Lifetime Product (μτₕ)	≥10-5cm2/V
17	Maximum Photocurrent (Unpolarized)	1000nA（60-second X-ray exposure，120KV）
18	X-ray Response Linearity	≥99%
19	X-ray Response Uniformity	≤10%
20	Energy Resolution	≤6%（Am241@59.5KeV)
21	Dimensions	Custom-made

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